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Updating unit test to verify expected values with the new maximum
vbatscale value. See #104.
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parent
c2b1420c07
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4 changed files with 20 additions and 10 deletions
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@ -25,6 +25,7 @@
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typedef struct batteryAdcToVoltageExpectation_s {
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uint16_t adcReading;
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uint16_t expectedVoltageInDeciVoltSteps;
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uint8_t scale;
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} batteryAdcToVoltageExpectation_t;
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#define ELEVEN_TO_ONE_VOLTAGE_DIVIDER 110 // (10k:1k) * 10 for 0.1V
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@ -34,17 +35,18 @@ TEST(BatteryTest, BatteryADCToVoltage)
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// given
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batteryConfig_t batteryConfig;
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batteryConfig.vbatscale = ELEVEN_TO_ONE_VOLTAGE_DIVIDER;
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batteryInit(&batteryConfig);
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batteryAdcToVoltageExpectation_t batteryAdcToVoltageExpectations[] = {
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{1420, 125},
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{1430, 126},
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{1440, 127},
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{1890, 167},
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{1900, 168},
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{1910, 169}
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{1420, 125, ELEVEN_TO_ONE_VOLTAGE_DIVIDER},
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{1430, 126, ELEVEN_TO_ONE_VOLTAGE_DIVIDER},
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{1440, 127, ELEVEN_TO_ONE_VOLTAGE_DIVIDER},
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{1890, 167, ELEVEN_TO_ONE_VOLTAGE_DIVIDER},
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{1900, 168, ELEVEN_TO_ONE_VOLTAGE_DIVIDER},
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{1910, 169, ELEVEN_TO_ONE_VOLTAGE_DIVIDER},
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{ 0, 0, VBAT_SCALE_MAX},
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{4096, 841, VBAT_SCALE_MAX}
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};
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uint8_t testIterationCount = sizeof(batteryAdcToVoltageExpectations) / sizeof(batteryAdcToVoltageExpectation_t);
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@ -52,7 +54,11 @@ TEST(BatteryTest, BatteryADCToVoltage)
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for (uint8_t index = 0; index < testIterationCount; index ++) {
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batteryAdcToVoltageExpectation_t *batteryAdcToVoltageExpectation = &batteryAdcToVoltageExpectations[index];
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printf("adcReading: %d\n", batteryAdcToVoltageExpectation->adcReading);
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batteryConfig.vbatscale = batteryAdcToVoltageExpectation->scale;
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printf("adcReading: %d, vbatscale: %d\n",
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batteryAdcToVoltageExpectation->adcReading,
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batteryAdcToVoltageExpectation->scale
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);
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uint16_t pointOneVoltSteps = batteryAdcToVoltage(batteryAdcToVoltageExpectation->adcReading);
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